Drop testing packaging is a novel way of testing the viability of
various packaging processes to ensure that packaged products arrive at
their destination safely. To accomplish this, a system is designed to
drop packages from varying heights onto a platform that rests upon load
cells placed beneath the platform. The load cells output the force of
the impact of the packaging. In addition, by making the platform
removable, different platforms can be constructed to test different
drops, such as dropping down stairs.
FUTEK’s Pancake Load Cells (LCF Series) coupled with USB530 High Speed, External USB Kit.
Four LCF series pancake load cells are mount on the four corners of the drop test machine base. The test platform is then bolted over the four load cells.
When a package is dropped, the load cells in each corner measure and send load data to the USB530 data acquisition unit.
The data collected is displayed, logged, and graphed via our SENSIT™ software on a PC.
By changing out the test platform, different drop scenarios can be simulated and recorded for study and compliance with testing standards such as ASTM D5276 and ISTA 1a, 2a, and 3a.